Enhanced performance consistency in nanoparticle/TIPS pentacene-based organic thin film transistors

Advanced Functional Materials

Volumn 21, Issue 19, 2011, Pages 3617-3623

  He, Zhengran ^a   Xiao, Kai ^b   Durant, William ^a   Hensley, Dale K ^b   Anthony, John E ^c   Hong, Kunlun ^b   Kilbey II, S Michael ^c,d   Chen, Jihua ^b   Li, Dawen ^a  

^a The Aerospace Engineering and Mechanics Department   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF KENTUCKY   (United States)

^d UNIVERSITY OF TENNESSEE   (United States)

Author keywords

anisotropy; crystallization; organic thin film transistors; SiO2 nanoparticles; TIPS pentacene

Indexed keywords

ACTIVE LAYER; AVERAGE MOBILITY; CRYSTAL ANISOTROPY; CRYSTAL MISORIENTATION; CRYSTALLINITIES; DROP-CAST; DROP-CASTING; ENHANCED PERFORMANCE; GRAZING INCIDENCE X-RAY DIFFRACTION; NANOPARTICLE CONCENTRATIONS; ORGANIC THIN FILM TRANSISTORS; PENTACENES; POLARIZED OPTICAL MICROSCOPY; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SILICA NANOPARTICLES; SOLUTION-PROCESSED; STANDARD DEVIATION; TIPS-PENTACENE;

ANISOTROPY; CRYSTALLIZATION; DROPS; GRAIN BOUNDARIES; MORPHOLOGY; NANOPARTICLES; OPTICAL MICROSCOPY; SILICA; SILICON COMPOUNDS; STATISTICS; THIN FILM TRANSISTORS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 80053236233     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201002656     Document Type: Article

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