Using phases retrieved from two-dimensional projections to facilitate structure solution from X-ray powder diffraction data

Journal of Applied Crystallography

Volumn 44, Issue 5, 2011, Pages 1023-1032

  Xie, Dan ^a   Baerlocher, Christian ^a   McCusker, Lynne B ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

charge flipping; powder diffraction; structure solution methodology; two dimensional phase retrieval; two dimensional X ray powder diffraction

Indexed keywords

CHARGE FLIPPING; PHASE RETRIEVAL; POWDER DIFFRACTION; STRUCTURE SOLUTIONS; X-RAY POWDER;

ALGORITHMS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRONS; POLYCRYSTALLINE MATERIALS; SILICATE MINERALS; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 80053023481     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811030214     Document Type: Article

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