Automated electron nanocrystallography

Materials Research Society Symposium Proceedings

Volumn 1026, Issue , 2008, Pages 20-29

  Spence, John ^a   McKeown, Joseph ^a   He, Haifeng ^b   Wu, Jinsong ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED COLLECTION; CRYSTALLINE NANOSTRUCTURE; DATA COLLECTION; DIFFRACTION DATA; ELECTRON DIFFRACTION DATA; KOEHLER; MICRODIFFRACTIONS; NANOCRYSTALLOGRAPHY; PHASE PROBLEM; REAL TIME; THREE DIMENSIONS;

ELECTRON DIFFRACTION;

ELECTRONS;

EID: 70350333918     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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