Powder diffraction line profiles from the size and shape of nanocrystallites

Journal of Applied Crystallography

Volumn 44, Issue 5, 2011, Pages 945-953

  Beyerlein, K R ^a,b   Snyder, R L ^a   Scardi, P ^b  

^a Georgia Institute of Technology   (United States)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

crystallite shape; crystallite size; line profile analysis; powder diffraction

Indexed keywords

DEBYE FUNCTION; LINE PROFILE ANALYSIS; NANOMETRES; NUMERICAL PROCEDURES; PEAK POSITION; PEAK PROFILES; POWDER DIFFRACTION; POWDER PATTERNS; RECIPROCAL SPACE; SIZE AND SHAPE; TANGENT PLANE;

DIFFRACTION; NANOCRYSTALLITES; SPHERES;

CRYSTALLITE SIZE;

EID: 80053002700     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811030743     Document Type: Article

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