Reducing the background from pressure vessels using a BRIM

Journal of Applied Crystallography

Volumn 44, Issue 5, 2011, Pages 1047-1053

  Wilkinson, Angus P ^a   Morelock, Cody R ^a   Greve, Benjamin K ^a   Jupe, Andrew C ^a   Chapman, Karena W ^b   Chupas, Peter J ^b   Kurtz, Charles ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

background; high pressure; high energy X rays; parasitic scattering; powder diffraction; Rietveld analysis

Indexed keywords

BACKGROUND; HIGH PRESSURE; HIGH-ENERGY X-RAYS; POWDER DIFFRACTION; RIETVELD;

DIFFRACTION; ELASTIC MODULI; HIGH ENERGY PHYSICS; PRESSURE VESSELS; RIETVELD ANALYSIS; X RAY POWDER DIFFRACTION;

RIETVELD REFINEMENT;

EID: 80052986216     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811028925     Document Type: Article

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