Signal-to-noise ratio in x ray dark-field imaging using a grating interferometer

Journal of Applied Physics

Volumn 110, Issue 5, 2011, Pages

  Chabior, Michael ^a   Donath, Tilman ^b,c   David, Christian ^b   Schuster, Manfred ^a   Schroer, Christian ^d   Pfeiffer, Franz ^e  

^a SIEMENS AG   (Germany)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c DECTRIS LTD   (Switzerland)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^e TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMPTOTIC BEHAVIORS; DARK FIELD IMAGES; DARK FIELD IMAGING; DARK-FIELD; EXPERIMENTAL INVESTIGATIONS; GRATING INTERFEROMETERS; HIGH FLUX; LABORATORY SET-UP; LOW FLUX; LOW SIGNAL-TO-NOISE RATIO; NOISE DISTRIBUTION; PHOTON COUNTING DETECTORS; POLYCHROMATIC SOURCE; RECONSTRUCTION ALGORITHMS; RICIAN DISTRIBUTION; SIGNAL TO NOISE; SIGNAL TRANSMISSION; TEST MEASUREMENTS;

ASYMPTOTIC ANALYSIS;

SIGNAL TO NOISE RATIO;

EID: 80052916129     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3630051     Document Type: Conference Paper

References (24)

1. U. Bonse and M. Hart, Appl. Phys. Lett. 6, 155 (1965). 10.1063/1.1754212
2. T. J. Davis, D. Gao, T. E. Gureyev, A. W. Stevenson, and S. W. Wilkins, Nature 373, 595 (1995). 10.1038/373595a0
3. S. W. Wilkins, T. E. Gureyev, D. Gao, A. Pogany, and A. W. Stevenson, Nature 384, 335 (1996). 10.1038/384335a0
4. L. D. Chapman, W. C. Thomlinson, R. E. Johnston, D. Washburn, E. Pisano, N. Gmuer, Z. Zhong, R. Menk, F. Arfelli, and D. Sayers, Phys. Med. Biol. 42, 2015 (1997). 10.1088/0031-9155/42/11/001
5. P. Spanne, C. Raven, I. Snigireva, and A. Snigirev, Phys. Med. Biol. 44, 741 (1999). 10.1088/0031-9155/44/3/016
6. J. Clauser, U.S. patent 5, 812, 629 (September 22, 1998).
7. C. David, B. Nhammer, H. H. Solak, and E. Ziegler, Appl. Phys. Lett. 81, 3287 (2002). 10.1063/1.1516611
8. A. Momose, Opt. Express 11, 2303 (2003). 10.1364/OE.11.002303
9. A. Momose, Jpn. J. Appl. Phys. 44, 6355 (2005). 10.1143/JJAP.44.6355
10. T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, Opt. Express 13, 6296 (2005). 10.1364/OPEX.13.006296
11. S. A. Zhou and A. Brahme, Phys. Med. 24, 129 (2008). 10.1016/j.ejmp.2008. 05.006
12. F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, Nature Phys. 2, 258 (2006). 10.1038/nphys265
13. F. Pfeiffer, C. Kottler, O. Bunk, and C. David, Phys. Rev. Lett. 98, 108105 (2007). 10.1103/PhysRevLett.98.108105
14. F. Pfeiffer, M. Bech, O. Bunk, P. Kraft, E. F. Eikenberry, Ch. Brnnimann, C. Grnzweig, and C. David, Nature Mater. 7, 134 (2008). 10.1038/nmat2096
15. V. Revol, C. Kottler, R. Kaufmann, U. Straumann, and C. Urban, Rev. Sci. Instrum. 81, 73709 (2010). 10.1063/1.3465334
16. R. Raupach and T. G. Flohr, Phys. Med. Biol. 56, 2219 (2011). 10.1088/0031-9155/56/7/020
17. M. Bech, O. Bunk, T. Donath, R. Feidenhans'l, C. David, and F. Pfeiffer, Phys. Med. Biol. 55, 5529 (2010). 10.1088/0031-9155/55/18/017
18. T. H. Yensen, M. Bech, O. Bunk, T. Donath, C. David, R. Feidenhans'l, and F. Pfeiffer, Phys. Med. Biol. 55, 3317 (2010). 10.1088/0031-9155/55/12/004
19. W. Yashiro, Y. Terui, K. Kawabata, and A. Momose, Opt. Express 18, 16890 (2010). 10.1364/OE.18.016890
20. S. O. Rice, Mathematical Analysis of Random Noise., Bell Syst. Technol. J. 23, 282-332 (1944);
21. S. O. Rice, Mathematical Analysis of Random Noise., Bell Syst. Technol. J. 24, 46-156 (1945).
22. W. C. Lindsey, IEEE Trans. Inf. Theory 10, 339 (1964). 10.1109/TIT.1964.1053703
23. J. O. Sijbers, A. J. den Dekker, E. Raman, and D. Van Dyck, Int. J. Imaging Syst. Technol. 10, 109 (1999). 10.1002/(SICI)1098-1098(1999)10: 2<>1.0.CO;2-#
24. C. David, J. Bruder, T. Rohbeck, C. Grnzweig, C. Kottler, A. Diaz, O. Bunk, and F. Pfeiffer, Microelectron. Eng. 84, 1172 (2007). 10.1016/j.mee.2007. 01.151