Highly reliable 26nm 64Gb MLC E2NAND (embedded-ECC & enhanced-efficiency) flash memory with MSP (Memory Signal Processing) controller

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2011, Pages 216-217

  Shim, Hyunyoung ^a   Lee, Seaung Suk ^a   Kim, Byungkook ^a   Lee, Namjae ^a   Kim, Doyoung ^a   Kim, Hankyum ^a   Ahn, Byungkeun ^a   Hwang, Youngho ^a   Lee, Hoseok ^a   Kim, Jumsoo ^a   Lee, Youngbok ^a   Lee, Heeyoul ^a   Lee, Juyeab ^a   Chang, Seungho ^a   Yang, Joongseob ^a   Park, Sungkye ^a   Aritome, Seiichi ^a   Lee, Seokkiu ^a   Ahn, Kun Ok ^a   Bae, Gihyun ^a   Yang, Yeseok ^a   more..

^a Hynix Semiconductor Inc   (South Korea)

Author keywords

E2NAND; MLC; MSP controller and reliability

Indexed keywords

DATA RETENTION; E2NAND; MLC; MSP CONTROLLER AND RELIABILITY; REDUCING PROCESS;

CONTROLLERS; SIGNAL PROCESSING;

FLASH MEMORY;

EID: 80052679436     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. K. Prall and K. Parat, "25nm 64Gb MLC NAND technology and scaling challenges," in IEDM Tech. Dig., 2010, pp.102-103.
2. C. Lee, et al, "A highly manufacturable integration technology for 27nm 2 and 3bit/cell NAND flash memory," in IEDM Tech. Dig., 2010, pp. 98-101.