25nm 64Gb MLC NAND technology and scaling challenges

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2010, Pages

  Prall, Kirk ^a   Parat, Krishna ^b  

^a MICRON TECHNOLOGY INC   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79951828928     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703300     Document Type: Conference Paper

References (5)

1. Tsukamoto, et. al, JJAP, Vol.46, No 4B 2007, pg. 2184
2. Lee, et. al., EDL, May 2002, pg. 264
3. Prall, NVSMW 2007, pg. 5
4. Tega, et. al., IEDM '06 , pg. 460
5. Compagnoni, et. al, TRED, Oct. 2008, pg. 2695