Nanocrystalline MoS2 through directional growth along the (0 0 2) crystal plane under high pressure

Materials Chemistry and Physics

Volumn 130, Issue 1-2, 2011, Pages 170-174

  Wang, Shanmin ^a   Wang, Zhao ^a,b   Qin, Jiaqian ^a   Wang, Wendan ^a   Li, Wenyong ^a   He, Duanwei ^a  

^a SICHUAN UNIVERSITY   (China)

^b HAINAN UNIVERSITY   (China)

Author keywords

Crystal growth; Defects; High pressure; Nanostructures

Indexed keywords

ANALYSIS TECHNIQUES; BRAGG REFLECTION; CRYSTAL PLANES; DEFECTS ANALYSIS; DIRECTIONAL GROWTH; GROWTH MECHANISMS; HEXAGONAL LAYERED STRUCTURE; HIGH PRESSURE; HIGH TEMPERATURE; LOW ENERGY SURFACES; MEASUREMENT RESULTS; NANOCRYSTALLINES; PEAK BROADENING; ROTATIONAL DISORDER; SAMPLE CELL; SCANNING ELECTRON MICROSCOPES; SCHERRER EQUATIONS; SEM OBSERVATION; WILLIAMSON-HALL; XRD TECHNIQUE;

CRYSTAL GROWTH; CRYSTAL STRUCTURE; DEFECTS; LASER OPTICS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MOLYBDENUM COMPOUNDS;

EID: 80052588956     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.06.024     Document Type: Article

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