Quantitative atom probe analysis of carbides

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 604-608

  Thuvander, M ^a   J Weidow, J ^a   Angseryd, J ^a,b   Falk, L K L ^a   Liu, F ^a   Sonestedt, M ^a   Stiller, K ^a   Andren H O ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b Sandvik Tooling   (Sweden)

Author keywords

Atom probe; Atom probe tomography; Carbides; Quantitative analysis

Indexed keywords

ATOMS; CARBIDES; CHEMICAL ANALYSIS; IONS; ISOTOPES; PROBES; SILICON CARBIDE;

ATOM PROBE; ATOM PROBE ANALYSIS; ATOM PROBE TOMOGRAPHY; CARBON CONCENTRATIONS; METALLIC MATERIAL; MULTIPLE EVENTS; NATURAL ISOTOPES; STANDARD EVALUATIONS;

ATOM LASERS;

CARBON; CARBON 13; NITROGEN; SILICON CARBIDE; TITANIUM DERIVATIVE; TUNGSTEN DERIVATIVE;

ANALYTIC METHOD; ARTICLE; ATOM PROBE ANALYSIS; CONCENTRATION (PARAMETERS); EVAPORATION; LASER PULSED ATOM PROBE TOMOGRAPHY; MATHEMATICAL COMPUTING; MEASUREMENT; QUANTITATIVE ANALYSIS; STOICHIOMETRY; TOMOGRAPHY;

EID: 80052536000     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.12.024     Document Type: Article

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