Microstructural investigation of Sr-modified Al-15 wt%Si alloys in the range from micrometer to atomic scale

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 695-700

  Timpel, M ^a   Wanderka, N ^a   Vinod Kumar, G S ^a,b   Banhart, J ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

3D atom probe; Al Si alloys; Sr modification

Indexed keywords

ATOMS; EUTECTICS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAMS; MICROSTRUCTURE; PROBES; SILICON; SILICON ALLOYS; STRONTIUM; STRONTIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

3D ATOM PROBES; AL-SI ALLOY; COMPLEMENTARY METHODS; DIFFERENT LENGTH SCALE; EUTECTIC MICROSTRUCTURE; FIBROUS MORPHOLOGY; MICROSTRUCTURAL INVESTIGATION; SR MODIFICATION;

ALUMINUM;

ALLOY; ALUMINUM; SILICON; STRONTIUM;

ANALYTIC METHOD; ARTICLE; ATOM PROBE TOMOGRAPHY; ATOMIC SCALE; CHEMICAL ANALYSIS; CHEMICAL PARAMETERS; CHEMICAL STRUCTURE; CONTROLLED STUDY; FOCUSED ION BEAM ENERGY SELECTIVE BACKSCATTERED TOMOGRAPHY; MELTING POINT; MICROMETER; THREE DIMENSIONAL IMAGING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80052532828     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.12.023     Document Type: Article

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