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Volumn 99, Issue 9, 2011, Pages

Effects of surface morphology on retention loss of ferroelectric domains in poly(vinylidenefluoride-co-trifluoroethylene) thin films

(4) Choi, Hyunwoo a,b Hong, Seungbum b Sung, Tae Hyun c No, Kwangsoo a

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b ARGONNE NATIONAL LABORATORY (United States)

c Hanyang University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC DOMAINS; MORPHOLOGICAL GRADIENT; NUCLEATION AND GROWTH KINETICS; PHASE REVERSAL; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; RETENTION LOSS;

FERROELECTRIC FILMS; FERROELECTRICITY; GROWTH KINETICS; MORPHOLOGY; NUCLEATION; THIN FILMS;

SURFACE MORPHOLOGY;

EID: 80052525863 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3632042 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.