Synthesis and optical properties of Mn doped ZnO thin films

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 9, 2011, Pages 2140-2143

  Chvostová, Dagmar ^a   Dejneka, Alexandr ^a   Hubička, Zdeněk ^a   Churpita, Alexander ^a   Bykov, Pavlo ^a   Jastrabík, Lubomír ^a   Trepakov, Vladimir A ^a,b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

doping; optical properties; synthesis; ZnO thin films

Indexed keywords

GROWTH TECHNIQUES; HOST MATRICES; MANGANESE CONCENTRATION; MN CONCENTRATIONS; MN-DOPED ZNO; OPTICAL AND ELECTRICAL PROPERTIES; SOLUBILITY LIMITS; ZNO; ZNO THIN FILM;

CONCENTRATION (PROCESS); ELECTRIC PROPERTIES; MANGANESE; MANGANESE OXIDE; METALLIC FILMS; OPTICAL FILMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTOR DOPING; SILICON COMPOUNDS; THIN FILMS; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 80052479064     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026630     Document Type: Article

References (17)

1. P. Sharma, A. Gupta, K. V. Rao, F. J. Owens, R. Sharma, R. Ahuja, J. M. Osorio Guillen, B. Johansson, and, G. A. Gehring, Nature Mater. 2, 673 (2003).
2. S. J. Pearton, C. R. Abernathy, D. P. Norton, A. F. Hebard, Y. D. Park, L. A. Boatner, and, I. D. Budai, Mater. Sci. Eng. R 40, 137 (2003).
3. F. Pan, C. Song, X. J. Liu, Y. C. Yang, and, F. Zeng, Mater. Sci. Eng. R 62, 1 (2008).
4. T. Dietl, H. Ohno, F. Matsukasa, J. Cibert, and, D. Ferrand, Science 287, 1019 (2000).
5. K. Sato, and, H. Katayama-Yoshida, Jpn. J. Appl. Phys. 2, 39 L555 (2000).
6. S. J. Pearton, W. H. Heo, M. Ivill, D. P. Norton, and, T. Steiner, Semicond. Sci. Technol. 19, R59 (2004).
7. D. Kundaliya, S. Ogale, S. Lofland, S. Dhar, C. Metting, S. Shinde, Z. Ma, B. Varughese, K. Ramanujachary, L. Salamanca-Riba, and, T. Venkatesan, Nature Mater. 3, 709 (2004).
8. M. A. Garcia, M. L. Ruiz-Gonzalez, A. Quesada, J. L. Costa-Kramer, J. F. Fernandez, S. J. Khatib, A. Wennberg, A. C. Caballero, M. S. Martín-Gonzáalez, M. Villegas, F. Briones, J. M. Gonzáalez-Calbet, and, A. Hernando, Phys. Rev. Lett. 94, 217206 (2005).
9. J. Zhang, R. Skomski, and, D. J. Sellmyer, J. Appl. Phys. 97, 10D303 (2005).
10. O. Churpita, Z. Hubicka, M. Cada, D. Chvostova, L. Soukup, and, L. Jastrabık, Surf. Coat. Technol. 1059, 174 (2003).
11. A. Dejneka, A. Churpita, Z. Hubicka, V. Trepakov, Z. Potucek, L. Jastrabik, G. Suchaneck, and, G. Gerlach, J. Nanosci. Nanotechnol. 9, 4094 (2009).
12. H. G. Tompkins, and, E. A. Irene, Handbook of Ellipsometry (William Andrews Publications, Norwich, NY, 2005).
13. H. Qing-Bo, Xu Jia-Yue, Li Xin-Hua, A. Kamzin, and, L. Kamzina, Chin. Phys. Lett. 24, 3499-3501 (2007).
14. J. M. Liu, C. K. Ong, and, L. C. Lim, Ferroelectrics 231, 223 (1999).
15. C. L. Du, Z. B. Gu, M. H. Lu, J. Wang, S. T. Zhang, J. Zhao, G. X. Cheng, H. Heng, and, Y. F. Chen, J. Appl. Phys. 99, 123515 (2006).
16. L. W. Yang, X. L. Wu, G. S. Huang, T. Qiu, and, Y. M. Yang, J. Appl. Phys. 97, 014308 (2005).
17. E. Chikoidze, Y. Dumont, F. Jomard, and, O. Gorochov, Thin Solid Films 515, 8519 (2007).