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Volumn 84, Issue 8, 2011, Pages

Tracking defect-induced ferromagnetism in GaN:Gd

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EID: 80052471554     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.081201     Document Type: Article
Times cited : (46)

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