Near-infrared photodetector with CuIn1-x AlxSe 2 thin film

Applied Physics Letters

Volumn 99, Issue 8, 2011, Pages

  Chang, Ruo Ping ^a   Perng, Dung Ching ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION LAYER; AL ELECTRODE; CU(IN ,AL)SE; CUT-OFF; EMISSION PEAKS; HIGHLY SENSITIVE; LOW TEMPERATURE PHOTOLUMINESCENCE; NEAR INFRA RED; NIR EXCITATION; NIR SPECTRUM; PHOTOCURRENT AMPLIFICATION; POLYCRYSTALLINE FILM; SCANNING ELECTRON MICROSCOPES; SMOOTH SURFACE;

ALUMINUM; CHEMICAL SENSORS; COPPER COMPOUNDS; OPTOELECTRONIC DEVICES; PHOTODETECTORS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; THIN FILMS; X RAY DIFFRACTION;

INFRARED DEVICES;

EID: 80052424981     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3627185     Document Type: Article

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