Sub-pixel porosity revealed by x-ray scatter dark field imaging

Journal of Applied Physics

Volumn 110, Issue 4, 2011, Pages

  Revol, V ^a,b   Jerjen, I ^c   Kottler, C ^a   Schtz, P ^c   Kaufmann, R ^a   Lthi, T ^c   Sennhauser, U ^c   Straumann, U ^b   Urban, C ^a  

^a CSEM   (Switzerland)

^b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM WELDING; DARK FIELD IMAGING; DETECTOR RESOLUTION; MICRON SCALE; MICROSCOPIC RESOLUTION; SUB PIXELS; TALBOT-LAU INTERFEROMETER; THREE-DIMENSIONAL RECONSTRUCTION; ULTRA-SMALL ANGLE X-RAY SCATTERINGS; WORK PIECES; X-RAY ENERGIES; X-RAY SCATTER;

ALUMINUM; INTERFEROMETERS; LAKES; X RAY TUBES;

X RAYS;

EID: 80052413421     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3624592     Document Type: Article

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17. See supplementary material at http://dx.doi.org/10.1063/1.3624592 E-JAPIAU-110-007116 for a movie showing a three-dimensional rendering of the weld volume.