Selective and efficient quantum process tomography without ancilla

Physical Review Letters

Volumn 107, Issue 10, 2011, Pages

  Schmiegelow, Christian Tomás ^a   Bendersky, Ariel ^a   Larotonda, Miguel Antonio ^b   Paz, Juan Pablo ^a  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^b Ministerio de Defensa   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ANCILLA; PARAMETER CHARACTERIZING; PHYSICAL RESOURCES; QUANTUM DEVICE; QUANTUM PROCESS; QUANTUM PROCESS TOMOGRAPHY; QUANTUM SYSTEM; SINGLE PHOTONS; SMALL SYSTEMS;

DISPLAY DEVICES; QUANTUM ELECTRONICS; QUANTUM OPTICS; TOMOGRAPHY;

MULTIPHOTON PROCESSES;

EID: 80052383060     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.100502     Document Type: Article

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