Transmission electron microscopy on Hf- and Ta-carbides sintered with TaSi2

Journal of the European Ceramic Society

Volumn 31, Issue 15, 2011, Pages 3033-3043

  Silvestroni, Laura ^a   Sciti, Diletta ^a  

^a INSTITUTE OF SCIENCE AND TECHNOLOGY FOR CERAMICS   (Italy)

Author keywords

Carbides; Densification; Microstructure; Transmission electron microscopy

Indexed keywords

COEFFICIENTS OF THERMAL EXPANSIONS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SUBGRAINS; TRIPLE JUNCTION;

ELECTRONS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HAFNIUM; MICROSTRUCTURE; SINTERED CARBIDES; SINTERING; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

TANTALUM CARBIDE;

EID: 80052372758     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2011.07.003     Document Type: Article

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