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Volumn 84, Issue 8, 2001, Pages 1891-1895

Microstructure in Silicon Nitride Containing β-Phase Seeding: III, Grain Growth and Coalescence

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; DENSIFICATION; DISLOCATIONS (CRYSTALS); GRAIN GROWTH; MOIRE FRINGES; SINTERING; STRAIN;

EID: 0035437574     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb00932.x     Document Type: Article
Times cited : (17)

References (9)
  • 1
    • 0032686536 scopus 로고    scopus 로고
    • Microstructure in Silicon Nitride Containing β-Phase Seeding
    • H.-H. Lu and J.-L. Huung, "Microstructure in Silicon Nitride Containing β-Phase Seeding, Part 1," J. Mater. Res., 14 [7] 2966-73 (1999).
    • (1999) J. Mater. Res. , vol.14 , Issue.7 PART 1 , pp. 2966-2973
    • Lu, H.-H.1    Huung, J.-L.2
  • 2
    • 4243583589 scopus 로고    scopus 로고
    • Microstructure in Silicon Nitride Containing β-Phase Seeding: II
    • in review
    • H.-H. Lu and J.-L. Huang, "Microstructure in Silicon Nitride Containing β-Phase Seeding: II," J. Am. Ceram. Soc., in review.
    • J. Am. Ceram. Soc.
    • Lu, H.-H.1    Huang, J.-L.2
  • 3
    • 0021374343 scopus 로고
    • Burgers Vector Determination of Dislocation in an Elastically Anisotropic Crystal by High-Order Reflection Imaging Techniques in an HVEM
    • H. Saka, "Burgers Vector Determination of Dislocation in an Elastically Anisotropic Crystal by High-Order Reflection Imaging Techniques in an HVEM," Philos. Mag. A. 49, 327 (1984).
    • (1984) Philos. Mag. A , vol.49 , pp. 327
    • Saka, H.1
  • 5
    • 0028479467 scopus 로고
    • Nucleation and Growth of β′-SiAION
    • S.-L. Hwang and I-W. Chen, "Nucleation and Growth of β′-SiAION," J. Am. Ceram. Soc., 77 [7] 1719-28 (1994).
    • (1994) J. Am. Ceram. Soc. , vol.77 , Issue.7 , pp. 1719-1728
    • Hwang, S.-L.1    Chen, I.-W.2
  • 6
    • 84981844029 scopus 로고
    • Electron Microscopy Transmission Image of Coherent Domain Boundaries
    • R. Gaver, P. Dilavignette, H. Blank, and S. Amlinckx, "Electron Microscopy Transmission Image of Coherent Domain Boundaries," Phys. Status Solidi, 4, 383 (1964).
    • (1964) Phys. Status Solidi , vol.4 , pp. 383
    • Gaver, R.1    Dilavignette, P.2    Blank, H.3    Amlinckx, S.4
  • 7
    • 0024754723 scopus 로고
    • Microstructural Changes in β-Silicon Nitride Grains upon Crystallizing the Grain-Boundary Glass
    • W. E. Lee and G. E. Hilmas, "Microstructural Changes in β-Silicon Nitride Grains upon Crystallizing the Grain-Boundary Glass," J. Am. Ceram. Soc., 72 [10] 1731-37 (1989).
    • (1989) J. Am. Ceram. Soc. , vol.72 , Issue.10 , pp. 1731-1737
    • Lee, W.E.1    Hilmas, G.E.2
  • 8
    • 0013132168 scopus 로고
    • Practical Electron Microscopy in Materials Science
    • N. V. Philips Gloeilampenfabrieken. Eindhoven, The Netherlands
    • J. W. Edington, "Practical Electron Microscopy in Materials Science"; pp. 41-45 in Interpreparation of Transmission Electron Micrographs, Vol. 3. N. V. Philips Gloeilampenfabrieken. Eindhoven, The Netherlands, 1974.
    • (1974) Interpreparation of Transmission Electron Micrographs , vol.3 , pp. 41-45
    • Edington, J.W.1
  • 9
    • 0030263211 scopus 로고    scopus 로고
    • Review: Silicon Nitride Crystal Structure and Observations of Lattice Defects
    • C. M. Wang, X. Q. Pan, M. Rühle, F. L. Riley, and M. Mitomo, "Review: Silicon Nitride Crystal Structure and Observations of Lattice Defects," J. Mater. Sci., 31, 5281-98 (1996).
    • (1996) J. Mater. Sci. , vol.31 , pp. 5281-5298
    • Wang, C.M.1    Pan, X.Q.2    Rühle, M.3    Riley, F.L.4    Mitomo, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.