Elaboration and characterization of nanocrystalline TiO2 thin films prepared by sol-gel dip-coating

Surface and Coatings Technology

Volumn 206, Issue 2-3, 2011, Pages 243-249

  Mechiakh, R ^a,b   Sedrine, N Ben ^b   Naceur, J Ben ^b   Chtourou, R ^b  

^a UNIVERSITY OF BATNA   (Algeria)

^b Centre de Recherches et des Technologies de l'Energie   (Tunisia)

Author keywords

Nano crystalline; Photocatalytic activity; Sol gel; Thin layers; TiO2

Indexed keywords

AMORPHOUS PHASE; ANATASE PHASE; ANNEALED FILMS; ANNEALING TEMPERATURES; COATED GLASS SUBSTRATES; CRYSTALLINE PHASE; ELLIPSOMETRIC ANALYSIS; EXTINCTION COEFFICIENTS; HEAT TREATMENT TEMPERATURE; LAYER THICKNESS; METHYLENE BLUE; NANOCRYSTALLINE TIO; NANOCRYSTALLINES; NANOCRYSTALLITE SIZE; OPTICAL CHARACTERIZATION; OPTICAL GAP; PHOTOCATALYTIC ACTIVITIES; PHOTOCATALYTIC ACTIVITY; SOL GEL DIP COATING; SOL-GEL DIP COATING TECHNIQUE; STRUCTURAL AND MORPHOLOGICAL PROPERTIES; THIN LAYERS; TIO; TIO2; UV-LIGHT IRRADIATION;

AMORPHOUS FILMS; ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; COATINGS; CRYSTALLINE MATERIALS; GELS; ITO GLASS; PHOTOCATALYSIS; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SOL-GEL PROCESS; SOL-GELS; SOLS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; TITANIUM; TITANIUM DIOXIDE; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

THIN FILMS;

EID: 80052346603     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.06.053     Document Type: Article

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