Electron bombarded semiconductor image sensors

Springer Series in Optical Sciences

Volumn 160, Issue , 2011, Pages 63-72

  Aebi, Verle ^a   Costello, Kenneth ^a  

^a Intevac Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80052332919     PISSN: 03424111     EISSN: 15561534     Source Type: Book Series    
DOI: 10.1007/978-3-642-18443-7_4     Document Type: Article

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