Elucidation of the complex structure of nanoparticles composed of bismuth, antimony, and tellurium using scanning transmission electron microscopy

Journal of Physical Chemistry C

Volumn 115, Issue 35, 2011, Pages 17334-17340

  Mott, Derrick M ^a   Mai, Nguyen T ^a   Thuy, Nguyen T B ^a   Sakata, Teruyoshi ^a   Higashimine, Koichi ^a   Koyano, Mikio ^a   Maenosono, Shinya ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION CORRECTION; ATOMIC-LEVEL RESOLUTION; ATOMIC-SCALE ANALYSIS; COMPLEX STRUCTURE; DARK-FIELD DETECTORS; NANODISCS; NANOPARTICLE STRUCTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURAL CHARACTERIZATION; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON; UNDERLYING MECHANISM;

ANTIMONY; ATOMS; BISMUTH; CHARACTERIZATION; NANOPARTICLES; NANOWIRES; SCANNING; TELLURIUM; TELLURIUM COMPOUNDS; WIRE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 80052311086     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp205588e     Document Type: Article

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