On the wear mechanism of thin nickel film during AFM-based scratching process using molecular dynamics

Journal of Mechanical Science and Technology

Volumn 25, Issue 8, 2011, Pages 2111-2120

  Khan, Hanif Muhammad ^a   Kim, Sung Gaun ^a  

^a Kongju National University   (South Korea)

Author keywords

AFM; Molecular dynamics; Nano scratching; NEMS; Nickel; Wear volume

Indexed keywords

ABRASIVE WEARS; AFM; ATOMIC FORCE MICROSCOPES; CENTROSYMMETRY; MONOCRYSTALLINE; NANOSCRATCHING; NEW PARAMETERS; NICKEL FILM; NICKEL THIN FILM; WEAR MECHANISMS; WEAR VOLUME; WEAR ZONES;

ATOMIC FORCE MICROSCOPY; MOLECULAR DYNAMICS; NICKEL; TRIBOLOGY; WEAR OF MATERIALS;

DYNAMICS;

EID: 80052250371     PISSN: 1738494X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12206-011-0606-6     Document Type: Article

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