Measuring sheet resistance of CIGS solar cell's window layer by spatially resolved electroluminescence imaging

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7493-7496

  Paire, Myriam ^a   Lombez, Laurent ^a   Guillemoles, Jean François ^a   Lincot, Daniel ^a  

^a CNRS   (France)

Author keywords

Electroluminescence; Sheet resistance; Thin film solar cells; Transparent conductive oxide

Indexed keywords

CIGS SOLAR CELLS; CONTACT GEOMETRY; IMAGING EXPERIMENTS; IN-PROCESS INSPECTION; LIGHT EMITTING DEVICES; QUANTITATIVE MODELS; SPATIALLY RESOLVED ELECTROLUMINESCENCE; THIN FILM SOLAR CELLS; TRANSPARENT CONDUCTIVE OXIDES; WINDOW LAYER; ZNO;

ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; EXPERIMENTS; LIGHT; SHEET RESISTANCE; ZINC OXIDE;

ELECTROLUMINESCENCE;

EID: 80052186105     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.214     Document Type: Conference Paper

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