XPS study of CZTSSe monograin powders

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7407-7411

  Danilson, M ^a   Altosaar, M ^a   Kauk, M ^a   Katerski, A ^a   Krustok, J ^a   Raudoja, J ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Cu2ZnSn(SexS1 x)4; Depth profiling; X ray photoelectron spectroscopy

Indexed keywords

BULK COMPOSITIONS; CORE LEVELS; DEPTH-PROFILE ANALYSIS; ION ETCHING; POWDER CRYSTALS; XPS SPECTRA;

BINDING ENERGY; CHALCOGENIDES; DEPTH PROFILING; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; POWDERS; SURFACE CLEANING; TIN;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 80052175119     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.165     Document Type: Conference Paper

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