Advanced loss analysis method for silicon wafer solar cells

Energy Procedia

Volumn 8, Issue , 2011, Pages 244-249

  Aberle, Armin G ^a   Zhang, Wu ^a   Hoex, Bram ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Loss analysis; Luminescence; Quantum efficiency; Reflectance; Silicon wafer solar cells; Superposition principle

Indexed keywords

CURVE FITTING; EFFICIENCY; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; LIGHT; LUMINESCENCE; MECHANICS; QUANTUM EFFICIENCY; REFLECTION; SILICON; SILICON WAFERS; SOLAR CELLS; TUNGSTEN;

ELECTROLUMINESCENCE INTENSITY; EQUIVALENT CIRCUIT MODEL; HEMISPHERICAL REFLECTANCE; HIGH-PRECISION MEASUREMENT; INTERNAL QUANTUM EFFICIENCY; LOSS ANALYSIS; SILICON WAFER SOLAR CELLS; SUPERPOSITION PRINCIPLE;

SILICON SOLAR CELLS;

EID: 80052088829     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.131     Document Type: Conference Paper

References (4)

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3. Metzdorf J, Calibration of solar cells 1: The differential spectral responsivity method, Appl Optics 1987; 26: 1701-7.
4. Kampwerth H, Trupke T, Weber JW, Augarten Y. Advanced luminescence based effective series resistance imaging of silicon solar cells. Appl Phys Lett 2008; 93: 202102-4.