In situ high temperature X-ray diffraction study of UO2 nanoparticles

Journal of Materials Science

Volumn 46, Issue 22, 2011, Pages 7247-7252

  Abril, R Jovani ^a   Eloirdi, R ^a   Bouexiere D ^a   Malmbeck, R ^a   Spino, J ^a  

^a JOINT RESEARCH CENTRE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE X-RAY DIFFRACTION; IN-SITU; LINEAR THERMAL EXPANSIONS; STRAIN EVOLUTION; THERMAL EXPANSION COEFFICIENTS; WATER MOLECULE; WEIGHT LOSS;

CRYSTALLITE SIZE; DESORPTION; DIFFERENTIAL THERMAL ANALYSIS; DIFFRACTION; EXPANSION; LATTICE CONSTANTS; NANOCRYSTALLITES; SINTERING; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

THERMAL EXPANSION;

EID: 80052068377     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-011-5684-4     Document Type: Article

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