Temperature and scattering contrast dependencies of thickness fluctuations in surfactant membranes

Journal of Chemical Physics

Volumn 135, Issue 7, 2011, Pages

  Nagao, Michihiro ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BICONTINUOUS PHASIS; DAMPING FREQUENCY; DATA QUALITY; HIGH TEMPERATURE; LOW TEMPERATURES; MICELLAR PHASIS; MODE AMPLITUDES; NEUTRON SPIN ECHO SPECTROSCOPIES; SCATTERING CONTRAST; SURFACTANT MEMBRANES; SURFACTANT MONOLAYERS; SWOLLEN LAMELLAR PHASE; TEMPERATURE RANGE; THICKNESS FLUCTUATIONS;

MONOLAYERS; NONIONIC SURFACTANTS; SCATTERING; THERMOTROPIC LIQUID CRYSTALS; VISCOSITY;

SPIN FLUCTUATIONS;

EID: 80052052519     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3625434     Document Type: Article

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