SCOPUS 정보 검색 플랫폼

Semiconductor Science and Technology

Volumn 26, Issue 9, 2011, Pages

Variable wavelength photocurrent mapping on PbS quantum dot: Fullerene thin films by conductive atomic force microscopy

(6) Madl, M a Brezna, W a Basnar, B a Yarema, M b Heiss, W b Smoliner, J a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b JOHANNES KEPLER UNIVERSITY LINZ (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; EXTERNAL SOURCES; FULLERENE DERIVATIVE; FULLERENE THIN FILMS; MEASUREMENT POINTS; MIXED FILMS; NEAR INFRARED; PHOTOACTIVITY; PIXEL SIZE; POWER CONVERSION EFFICIENCIES; TUNEABLE LASER;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; CONVERSION EFFICIENCY; FULLERENES; LIGHT SOURCES; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; TOPOGRAPHY;

PHOTOCURRENTS;

EID: 80052016529 PISSN: 02681242 EISSN: 13616641 Source Type: Journal
DOI: 10.1088/0268-1242/26/9/095002 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.