SCOPUS 정보 검색 플랫폼

ChemSusChem

Volumn 4, Issue 8, 2011, Pages 1124-1129

Remarkable impact of water on the discharge performance of a silicon-air battery

(3) Cohn, Gil a MacDonald, Digby D b Ein Eli, Yair a

a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

b PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

batteries; electrochemistry; ionic liquids; oxidation; silicon

Indexed keywords

ELECTROLYTES; IONIC LIQUIDS; IONS; SILICON; SILICON COMPOUNDS; SILICON OXIDES; SURFACE MORPHOLOGY;

AIR CATHODE; AIR ELECTRODES; ANODE SURFACES; CAPACITY LOSS; CELL CAPACITY; CELL PERFORMANCE; DISCHARGE CAPACITIES; DISCHARGE PERFORMANCE; HUMID ENVIRONMENT; IN-DEPTH STUDY; IONIC LIQUID ELECTROLYTES; LIQUID ELECTROLYTES; REMARKABLE IMPACT; SURFACE FILMS; WATER ADDITION;

WATER CONTENT;

ELECTROLYTE; IONIC LIQUID; SILICON; WATER;

AIR; ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRODE; METHODOLOGY; POWER SUPPLY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; X RAY PHOTOELECTRON SPECTROSCOPY;

AIR; ELECTRIC POWER SUPPLIES; ELECTROCHEMISTRY; ELECTRODES; ELECTROLYTES; IONIC LIQUIDS; MICROSCOPY, ELECTRON, SCANNING; PHOTOELECTRON SPECTROSCOPY; SILICON; SURFACE PROPERTIES; WATER;

EID: 80051979066 PISSN: 18645631 EISSN: 1864564X Source Type: Journal
DOI: 10.1002/cssc.201100169 Document Type: Article

Times cited : (38)

References (18)

1
- 0029769438
- K. M. Abraham, Z. Jiang, J. Electrochem. Soc. 1996, 143, 1-5.
- (1996) J. Electrochem. Soc. , vol.143 , pp. 1-5
- Abraham, K.M.¹ Jiang, Z.²

2
- 0142053170
- AA 1356
- J. Read, K. Mutolo, M. Ervin, W. Behl, J. Wolfenstine, A. Driedger, D. Foster, J. Electrochem. Soc. 2003, 150, A 1351 -A 1356.
- (2003) J. Electrochem. Soc. , vol.150 , pp. 1351
- Read, J.¹ Mutolo, K.² Ervin, M.³ Behl, W.⁴ Wolfenstine, J.⁵ Driedger, A.⁶ Foster, D.⁷

3
- 32044453597
- T. Ogasawara, A. Débart, M. Holzapfel, P. Novák, P. G. Bruce, J. Am. Chem. Soc. 2006, 128, 1390-1393.
- (2006) J. Am. Chem. Soc. , vol.128 , pp. 1390-1393
- Ogasawara, T.¹ Débart, A.² Holzapfel, M.³ Novák, P.⁴ Bruce, P.G.⁵

4
- 70349742806
- G. Cohn, D. Starosvetsky, R. Hagiwara, D. D. Macdonald, Y. Ein-Eli, Electrochem. Commun. 2009, 11, 1916-1918.
- (2009) Electrochem. Commun. , vol.11 , pp. 1916-1918
- Cohn, G.¹ Starosvetsky, D.² Hagiwara, R.³ MacDonald, D.D.⁴ Ein-Eli, Y.⁵

5
- 77950298793
- G. Cohn, Y. Ein-Eli, J. Power Sources 2010, 195, 4963-4970.
- (2010) J. Power Sources , vol.195 , pp. 4963-4970
- Cohn, G.¹ Ein-Eli, Y.²

6
- 62349097136
- S. Hasegawa, N. Imanishi, T. Zhang, J. Xie, A. Hirano, Y. Takeda, O. Yamamoto, J. Power Sources 2009, 189, 371-377.
- (2009) J. Power Sources , vol.189 , pp. 371-377
- Hasegawa, S.¹ Imanishi, N.² Zhang, T.³ Xie, J.⁴ Hirano, A.⁵ Takeda, Y.⁶ Yamamoto, O.⁷

7
- 54949116263
- AA 969
- T. Zhang, N. Imanishi, S. Hasegawa, A. Hirano, J. Xie, Y. Takeda, O. Yamamoto, N. Sammes, J. Electrochem. Soc. 2008, 155, A 965 -A 969.
- (2008) J. Electrochem. Soc. , vol.155 , pp. 965
- Zhang, T.¹ Imanishi, N.² Hasegawa, S.³ Hirano, A.⁴ Xie, J.⁵ Takeda, Y.⁶ Yamamoto, O.⁷ Sammes, N.⁸

8
- 69149096215
- AA 135
- T. Zhang, N. Imanishi, S. Hasegawa, A. Hirano, J. Xie, Y. Takeda, O. Yamamoto, N. Sammes, Electrochem. Solid State Lett. 2009, 12, A 132 -A 135.
- (2009) Electrochem. Solid State Lett. , vol.12 , pp. 132
- Zhang, T.¹ Imanishi, N.² Hasegawa, S.³ Hirano, A.⁴ Xie, J.⁵ Takeda, Y.⁶ Yamamoto, O.⁷ Sammes, N.⁸

9
- 77954772569
- J. Zhang, W. Xu, W. Liu, J. Power Sources 2010, 195, 7438-7444.
- (2010) J. Power Sources , vol.195 , pp. 7438-7444
- Zhang, J.¹ Xu, W.² Liu, W.³

10
- 77949484954
- J. Zhang, D. Wang, W. Xu, J. Xiao, R. E. Williford, J. Power Sources 2010, 195, 4332-4337.
- (2010) J. Power Sources , vol.195 , pp. 4332-4337
- Zhang, J.¹ Wang, D.² Xu, W.³ Xiao, J.⁴ Williford, R.E.⁵

11
- 0347051560
- DD 199
- R. Hagiwara, K. Matsumoto, Y. Nakamori, T. Tsuda, Y. Ito, H. Matsumoto, K. Momota, J. Electrochem. Soc. 2003, 150, D 195 -D 199.
- (2003) J. Electrochem. Soc. , vol.150 , pp. 195
- Hagiwara, R.¹ Matsumoto, K.² Nakamori, Y.³ Tsuda, T.⁴ Ito, Y.⁵ Matsumoto, H.⁶ Momota, K.⁷

12
- 37449007545
- T. Tsuda, R. Hagiwara, J. Fluorine Chem. 2008, 129, 4-13.
- (2008) J. Fluorine Chem. , vol.129 , pp. 4-13
- Tsuda, T.¹ Hagiwara, R.²

13
- 0042027235
- R. Hagiwara, Y. Ito, J. Fluorine Chem. 2000, 105, 221-227.
- (2000) J. Fluorine Chem. , vol.105 , pp. 221-227
- Hagiwara, R.¹ Ito, Y.²

14
- 0000915869
- P. Czuprynski, O. J. Joubert, Vac. Sci. Technol. B 1998, 16, 1051-1058.
- (1998) Vac. Sci. Technol. B , vol.16 , pp. 1051-1058
- Czuprynski, P.¹ Joubert, O.J.²

15
- 0039680376
- J. T. Baek, H. Park, K. Cho, H. J. Yoo, S. W. Kang, B. T. Ahn, J. Appl. Phys. 1995, 78, 7074-7079.
- (1995) J. Appl. Phys. , vol.78 , pp. 7074-7079
- Baek, J.T.¹ Park, H.² Cho, K.³ Yoo, H.J.⁴ Kang, S.W.⁵ Ahn, B.T.⁶

16
- 2142780806
- in, Perkin-Elmer Corp. Physical Electronics Division, Eden Prairie
- C. D. Wanger, W. M. Riggs, L. E. Davis, J. F. Moulder, G. E. Muilenberg, in Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corp., Physical Electronics Division, Eden Prairie, 1979.
- (1979) Handbook of X-ray Photoelectron Spectroscopy
- Wanger, C.D.¹ Riggs, W.M.² Davis, L.E.³ Moulder, J.F.⁴ Muilenberg, G.E.⁵

17
- 31644443317
- K. J. Kim, K. T. Park, J. W. Lee, Thin Solid Films 2006, 500, 356-359.
- (2006) Thin Solid Films , vol.500 , pp. 356-359
- Kim, K.J.¹ Park, K.T.² Lee, J.W.³

18
- 0004018774
- Kluwer Academic/Plenum, New York
- X. G. Zhang, Electrochemistry of Silicon and its Oxide, Kluwer Academic/Plenum, New York 2001.
- (2001) Electrochemistry of Silicon and Its Oxide
- Zhang, X.G.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.