Optical and structural characterization of terbium-doped Y 2SiO5 phosphor particles

Journal of Physical Chemistry C

Volumn 115, Issue 33, 2011, Pages 16630-16636

  Ricci, P C ^a   Carbonaro, C M ^a   Corpino, R ^a   Cannas, C ^a   Salis, M ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER MECHANISMS; CHARGE TRANSFER PROCESS; DOPING CONCENTRATION; EXCITED LEVELS; EXPERIMENTAL DATA; FLUORESCENCE QUANTUM YIELD; GREEN PHOSPHOR; KINETICS MODELS; MATRIX; MERCURY-FREE; NON-RADIATIVE CHANNELS; PHOSPHOR PARTICLES; RADIO-LUMINESCENCE; RAMAN ANALYSIS; SOL-GEL ROUTES; SPACE GROUPS; STRUCTURAL CHARACTERIZATION; TB-DOPED; THREE-LEVEL; TIME-RESOLVED LUMINESCENCE; X RAY MEASUREMENTS; YTTRIUM OXYORTHOSILICATE;

CHARGE TRANSFER; FLUORESCENCE; FLUORESCENT LAMPS; ION EXCHANGE; MERCURY (METAL); OPTICAL PROPERTIES; PHOSPHORS; QUANTUM YIELD; RADIOLOGY; SILICON COMPOUNDS; SOL-GEL PROCESS; TERBIUM; X RAY RADIOGRAPHY; YTTRIUM;

LIGHT EMISSION;

EID: 80051939536     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp203523s     Document Type: Article

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