Structural characterization of Lu1.8 Y0.2 Si O5 crystals

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 5, 2007, Pages

  Chiriu, Daniele ^a   Faedda, Nicola ^a   Lehmann, Alessandra Geddo ^a   Ricci, Pier Carlo ^a   Anedda, Alberto ^b   Desgreniers, Serge ^c   Fortin, Emery ^c  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b Cittadella Universitaria SP No 8   (Italy)

^c UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547991804     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.054112     Document Type: Article

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