An n-type transparent conducting oxide: Nb12O29

Journal of Physical Chemistry C

Volumn 115, Issue 33, 2011, Pages 16625-16629

  Ohsawa, Takeo ^a   Okubo, Junpei ^a   Suzuki, Tohru ^a   Kumigashira, Hiroshi ^b,c   Oshima, Masaharu ^b,c   Hitosugi, Taro ^a,c  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AT-WAVELENGTH; CONDUCTING PROPERTIES; EFFECTIVE MASS; HIGH CONDUCTIVITY; HIGH REFRACTIVE INDEX; HIGH TEMPERATURE STABILITY; HIGH TRANSMITTANCE; HIGH TRANSPARENCY; IN-VACUUM; MIXED-VALENT; OPTICAL DIELECTRIC CONSTANT; PHOTOEMISSION MEASUREMENTS; ROOM TEMPERATURE; TRANSPARENT CONDUCTING OXIDE;

CARRIER MOBILITY; GALVANOMAGNETIC EFFECTS; HALL MOBILITY; LEAD OXIDE; REFRACTIVE INDEX;

NIOBIUM OXIDE;

EID: 80051924554     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp203021u     Document Type: Article

References (34)

1. Ginley, D. S.; Bright, C. MRS Bull. 2000, 25, 15-18
2. Hamberg, I.; Granqvist, C. G. J. Appl. Phys. 1986, 60, R123-R159
3. Tahar, R. B. H.; Ban, T.; Ohya, Y.; Takahashi, Y. J. Appl. Phys. 1998, 83, 2631-2645
4. Hosono, H.; Ohta, H.; Orita, M.; Ueda, K.; Hirano, M. Vacuum 2002, 66, 419-425
5. Ohta, H.; Orita, M.; Hirano, M.; Tanji, H.; Kawazoe, H.; Hosono, H. Appl. Phys. Lett. 2000, 76, 2740-2742
6. Minami, T.; Nanto, H.; Takata, S. Jpn. J. Appl. Phys. 1984, 23, L280-L282
7. Minami, T. Semicond. Sci. Technol. 2005, 20, S35-S44
8. Pimputkar, S.; Speck, J. S.; DenBaars, S. P.; Nakamura, S. Nat. Photonics 2009, 3, 180-182
9. Kasai, J.; Hitosugi, T.; Moriyama, M.; Goshonoo, K.; Hoang, N. L. H.; Nakao, S.; Yamada, N.; Hasegawa, T. J. Appl. Phys. 2010, 107, 053110
10. Furubayashi, Y.; Hitosugi, T.; Yamamoto, Y.; Inaba, K.; Kinoda, G.; Hirose, Y.; Shimada, T.; Hasegawa, T. Appl. Phys. Lett. 2005, 86, 252101
11. "Critical Materials Strategy Summary", U.S. Department of Energy (DOE), December 2010, http://www.energy.gov/news/documents/ criticalmaterialsstrategy.pdf.
12. Cava, R. J.; Batlogg, B.; Krajewski, J. J.; Gammel, P.; Poulsen, H. F.; Peck, W. F., Jr. ; Rupp, L. W., Jr. Nature 1991, 350, 598-600
13. Cava, R. J.; Batlogg, B.; Krajewski, J. J.; Poulsen, H. F.; Gammel, P.; Peck, W. F., Jr. ; Rupp, L. W., Jr. Phys. Rev. B 1991, 44, 6973-6981
14. Lappas, A.; Waldron, J. E. L.; Green, M. A.; Prassides, K. Phys. Rev. B 2002, 65, 134405
15. Llunell, M.; Alemany, P. J. Solid State Chem. 2000, 149, 176-179
16. Waldron, J. E. L.; Green, M. A.; Neumann, D. A. J. Am. Chem. Soc. 2001, 123, 5833-5834
17. Sayagués, M. J.; Hutchison, J. L. J. Solid State Chem. 1999, 146, 202-210
18. Johnsson, M.; Kihlborg, L. Int. J. Inorg. Mater. 2000, 2, 477-481
19. Sayagués, M. J.; Krumeich, F.; Hutchison, J. L. Micron 2001, 32, 457-471
20. Rüscher, C.; Salje, E.; Hussain, A. J. Phys. C: Solid State Phys. 1988, 21, 3737-3749
21. Musil, J.; Baroch, P.; Vlček, J.; Nam, K. H.; Han, J. G. Thin Solid Films 2005, 475, 208-218
22. Afanasiev, P. J. Phys. Chem. B 2005, 109, 18293-18300
23. Ohta, H.; Matsuoka, Y.; Asahi, R.; Kato, T.; Ikuhara, Y.; Nomura, K.; Hosono, H. Appl. Phys. Lett. 2009, 95, 113505
24. Andersen, E. N.; Klimczuk, T.; Miller, V. L.; Zandbergen, H. W.; Cava, R. J. Phys. Rev. B 2005, 72, 033413
25. Cheng, J.-G.; Zhou, J.-S.; Goodenough, J. B.; Zhou, H. D.; Wiebe, C. R.; Takami, T.; Fujii, T. Phys. Rev. B 2009, 80, 134428
26. Waldron, J. E. L.; Green, M. A.; Neumann, D. A. J. Phys. Chem. Solids 2004, 65, 79-86
27. Anderson, J. S. Chem. Scr. 1978, 14, 129
28. Kamisaka, H.; Hitosugi, T.; Suenaga, T.; Hasegawa, T.; Yamashita, K. J. Chem. Phys. 2009, 131, 034702
29. Furubayashi, Y.; Yamada, N.; Hirose, Y.; Yamamoto, Y.; Otani, M.; Hitosugi, T.; Shimada, T.; Hasegawa, T. J. Appl. Phys. 2007, 101, 093705
30. Takizawa, M.; Wadati, H.; Tanaka, K.; Hashimoto, M.; Yoshida, T.; Fujimori, A.; Chikamatsu, A.; Kumigashira, H.; Oshima, M.; Shibuya, K.; Mihara, T.; Ohnishi, T.; Lippmaa, M.; Kawasaki, M.; Koinuma, H.; Okamoto, S.; Millis, A. J. Phys. Rev. Lett. 2006, 97, 057601
31. Kumigashira, H.; Minohara, M.; Takizawa, M.; Fujimori, A.; Toyota, D.; Ohkubo, I.; Oshima, M.; Lippmaa, M.; Kawasaki, M. Appl. Phys. Lett. 2008, 92, 122105
32. Morris, D.; Dou, Y.; Rebane, J.; Mitchell, C. E. J.; Egdell, R. G.; Law, D. S. L.; Vittadini, A.; Casarin, M. Phys. Rev. B 2000, 61, 13445-13457
33. Atuchin, V. V.; Kalabin, I. E.; Kesler, V. G.; Pervukhina, N. V. J. Electron Spectrosc. Relat. Phenom. 2005, 142, 129-134
34. Kuznetsov, M. V.; Razinkin, A. S.; Shalaeva, E. V. J. Struct. Chem. 2009, 50, 514-521