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Volumn 3, Issue 6, 2011, Pages 1038-1044

Exploitation of Surface-Sensitive Electrons in Scanning Electron Microscopy Reveals the Formation Mechanism of New Cubic and Truncated Octahedral CeO2 Nanoparticles

(5) Asahina, Shunsuke a,b Takami, Seiichi a Otsuka, Takeshi c Adschiri, Tadafumi a Terasaki, Osamu d,e

a TOHOKU UNIVERSITY (Japan)

b JEOL (France)

c JEOL LTD (Japan)

d Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

e STOCKHOLM UNIVERSITY (Sweden)

Author keywords

Cerium; Electron microscopy; Hybrid materials; Supported catalysts

Indexed keywords

EID: 80051824371 PISSN: 18673880 EISSN: 18673899 Source Type: Journal
DOI: 10.1002/cctc.201000348 Document Type: Article

Times cited : (21)

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