A Raman spectroscopic study of the XeOF4/XeF2 system and the X-ray crystal structure of α-XeOF4·XeF 2

Journal of Fluorine Chemistry

Volumn 132, Issue 10, 2011, Pages 660-668

  Hughes, Michael J ^a   Brock, David S ^a   Mercier, Hélne P A ^a   Schrobilgen, Gary J ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Noble gas chemistry; Raman spectroscopy; Weakly bonding interactions; X ray crystallography; Xenon difluoride; Xenon oxide tetrafluoride

Indexed keywords

EID: 80051791574     PISSN: 00221139     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jfluchem.2011.05.010     Document Type: Article

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