Monitoring high-yields processes with defects count in nonconforming items by artificial neural network

Applied Mathematics and Computation

Volumn 188, Issue 1, 2007, Pages 262-270

  Abbasi, Babak ^a   Akhavan Niaki, Seyed Taghi ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Artificial neural network; Generalized Poisson model; High yields processes; Statistical process control

Indexed keywords

NEURAL NETWORKS; POISSON DISTRIBUTION; STATISTICAL PROCESS CONTROL;

CUMULATIVE COUNTS OF CONFORMING; GENERALIZED POISSON MODEL; HIGH-YIELDS PROCESSES;

PROCESS MONITORING;

EID: 34247593467     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.amc.2006.09.114     Document Type: Article

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