Characterizing Current Conduction in Coated Conductors Using Transport and Contact-Free Magnetic Methods

High Temperature Superconductors

Volumn , Issue , 2010, Pages 49-65

  Polat, Özgür ^a,b   Thompson, James R ^a,b   Christen, David K ^a   Kumar, Dhananjay ^a,c   Martin, Patrick M ^e   Cook, Sylvester W ^a   List, Frederick A ^a   Sinclair, John W ^b   Selvamanickam, Venkat ^d   Chen, Yimin M ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

^c North Carolina Agricultural and Technical State University   (United States)

^d SUPERPOWER INC   (United States)

^e NONE

Author keywords

Critical current density versus magnetic field; Cuprates; Irreversible magnetization; Magnetic relaxation (flux creep); Nanoscale imperfections and pinning; Swept magnetic field; Transport critical current density; Vortex dynamics

Indexed keywords

EID: 79961202031     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527631049.ch2     Document Type: Chapter

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