Current-voltage characteristics of melt-textured YBCO obtained from the field-sweep rate dependence of magnetization

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 2651-2654

  Yamasaki, Hirofumi ^a   Mawatari, Yasunori ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FLUX; MAGNETIC RELAXATION; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; X RAY DIFFRACTION ANALYSIS;

FIELD SWEEP RATE; FLUX CREEP; MELT TEXTURED OXIDE SUPERCONDUCTOR;

OXIDE SUPERCONDUCTORS;

EID: 0032684454     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.785031     Document Type: Article

References (16)

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