Critical thickness investigation of magnetic properties in exchange-coupled bilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 22, 2011, Pages

  Rodriguez Suarez R L ^a   Vilela Leao L H ^b   Bueno, T ^b   Oliveira, A B ^c   De Almeida, J R L ^b   Landeros, P ^d   Rezende, S M ^b   Azevedo, A ^b  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^b FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO NORTE   (Brazil)

^d DEPARTAMENTO DE FÍSICA   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961151950     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.224418     Document Type: Article

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