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Volumn 87, Issue 9 III, 2000, Pages 6421-6423

Measurements of exchange anisotropy in NiFe/NiO films with different techniques

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[No Author keywords available]

Indexed keywords


EID: 0001139273     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372725     Document Type: Article
Times cited : (60)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.