Influence of the oxidation-reduction process on the surface and sub-surface microstructure of intercritically annealed CMnSi TRIP steel

ISIJ International

Volumn 51, Issue 4, 2011, Pages 630-637

  Gong, Young Feng ^a   De Cooman, Bruno Charles ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Hot dip galvanizing; Oxidation reduction; Trip steel

Indexed keywords

ADHESION PROBLEM; BARE SPOTS; EMBEDDED GRAINS; FILM-FORMING; GRAIN BOUNDARY NETWORK; HOT-DIP GALVANIZING; LARGE PORES; MATRIX; OXIDATION-REDUCTION; OXIDE REDUCTION; POROUS STRUCTURES; PRE-OXIDATION; SUB-SURFACES; SUBSEQUENT REDUCTION; TRIP-STEEL;

ANNEALING; BEARINGS (STRUCTURAL); GALVANIZING; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD OXIDE; MANGANESE OXIDE; METALLIC COMPOUNDS; OXIDE FILMS; SILICON COMPOUNDS; SURFACE DEFECTS; TRANSMISSION ELECTRON MICROSCOPY; ZINC;

INTERNAL OXIDATION;

EID: 79961069579     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.51.630     Document Type: Article

References (26)

1. ) B.C. De Cooman: Curr. Opin. Solid State Mater. Sci., 8 (2004), 285.
2. J. Mahieu, S. Claessens and B. C. De Cooman: Metall. Maler. Trans. A, 32, (2001), 2905.
3. A. R. Marder: Prog. Mater. Sci., 45 (2000), 193.
4. X. Vanden Eynde, J. P. Servais and M. Lamberigts: Surf. Int. Anal, 35 (2003), 1004.
5. J. Mahieu, S. Claessens, B. C. De Cooman and F. Goodwin: Proc. 6th Int. Conf. on Zinc and Zinc Alloy Coated Steel Sheet (GALVATECH 2004), ed. by M. A. Baker, Association for Iron and Steel Technology, Warrendale, PA, (2004), 529.
6. Y. F. Gong, Han S. Kim and B. C. De Cooman: ISIJ Int., 49 (2009), 557.
7. Y. F. Gong, Han S. Kim and B. C. De Cooman: ISIJ Int., 48 (2008), 1745.
8. X. S. Li, S.-I. Baek, C-S. Oh, S.-J. Kim and Y.-W. Kim: Scr. Mater., 57(2007), 113.
9. M. Lamberigts, J.-P. Servais: ECSC Final Report 7210 EC/203, (1994).
10. K. Nishimura, T. Ohara, R. Mizoguchi, S. Fuji: European Patent EP 0480122(Bl), (1992).
11. T. Matsumoto: CAMP-ISIJ, 4 (1991), 1632.
12. R. Nakanishi, H. Irie, M. Nakamura, K. Okamoto and M. Shimizu: European Patent EP 1829 983 (A1), (2007).
13. L. Bordignon and X. Vanden Eynde: European Patent EP 1999 287 (A1), (2009).
14. L. Bordignon, X. Vanden Eynde and R. Fransen: Rev. Métall, JulyAugust (2004), No. 7-8, 559.
15. L. Bordignon, R. Fransen, R. Leuschner, W. Warnecke and G. Angeli: EUR Report Number 22014, (2006).
16. D. Geneve, D. Rouxel, P. Pigeat, B. Weber and M. Confente: Appl. Surf. Sci., 254 (2008), 5348.
17. D. Geneve, D. Rouxel, P. Pigeat, B. Weber and M. Confente: Mater. Sci. Eng. A, 435-436, (2006), 1.
18. S. R. J. Saunders, M. Montiero and F. Rizzo, Prog. Mater. Sci., 53 (2008), 775.
19. R. Dieckmann and H. Schmalzreid: Ber. BunsenGes. Phys. Chem., 81 (1977), 344.
20. S.Tinkler, R. Dieckmann: J. Mater. Sci, 27, (1992), 3799.
21. A. K. Galwey, D. M. Jamieson, B. R. Wheeler and R. Reed: Corros. Sci, 14 (1974), 527.
22. I. Wolf and H. J. Grabke: Solid State Commun., 54 (1985), No. 1, 5.
23. J. Manenc and G. Vagnard: Corros. Sci, 9 (1969), 857.
24. H. J. Engell: Z. Electrochemie, 63 (1959), 835.
25. M. C. Pandey: Oxid. Met., 48 (1997), No. 1-2, 129.
26. P. Franke and R. Dieckmann: J. Phys. Chem. Solids, 51, No. 1, 45.