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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 9, 2011, Pages

Antiferromagnetic layer thickness dependence of the magnetization reversal in the epitaxial MnPd/Fe exchange bias system

(3) Zhan, Qing Feng a,b Zhang, Wei a Krishnan, Kannan M a

a UNIVERSITY OF WASHINGTON (United States)

b NINGBO INSTITUTE OF MATERIALS TECHNOLOGY AND ENGINEERING (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961041352 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.094404 Document Type: Article

Times cited : (40)

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