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Volumn 17, Issue 1 PART 1, 2008, Pages
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A new method of dynamic bottleneck detection for semiconductor manufacturing line
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NONE
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Author keywords
Flexible and reconfigurable manufacturing systems; Intelligent manufacturing systems; Manufacturing plant control
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Indexed keywords
BOTTLENECK DETECTION;
EXPONENTIAL FUNCTIONS;
FLEXIBLE AND RECONFIGURABLE MANUFACTURING SYSTEMS;
HEAVY LOADS;
INTELLIGENT MANUFACTURING SYSTEMS;
LIGHT LOADS;
MANUFACTURING PLANT CONTROL;
REAL-TIME CALCULATIONS;
SEMICONDUCTOR MANUFACTURING LINE;
WORKING STATIONS;
INSPECTION;
MANUFACTURE;
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EID: 79961018742
PISSN: 14746670
EISSN: None
Source Type: Conference Proceeding
DOI: 10.3182/20080706-5-KR-1001.3201 Document Type: Conference Paper |
Times cited : (11)
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References (8)
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