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Volumn 17, Issue 1 PART 1, 2008, Pages

A new method of dynamic bottleneck detection for semiconductor manufacturing line

(3)  Wang, Zhongjie a   Chen, Jun a   Wu, Qidi a  

a NONE

Author keywords

Flexible and reconfigurable manufacturing systems; Intelligent manufacturing systems; Manufacturing plant control

Indexed keywords

BOTTLENECK DETECTION; EXPONENTIAL FUNCTIONS; FLEXIBLE AND RECONFIGURABLE MANUFACTURING SYSTEMS; HEAVY LOADS; INTELLIGENT MANUFACTURING SYSTEMS; LIGHT LOADS; MANUFACTURING PLANT CONTROL; REAL-TIME CALCULATIONS; SEMICONDUCTOR MANUFACTURING LINE; WORKING STATIONS;

EID: 79961018742     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20080706-5-KR-1001.3201     Document Type: Conference Paper
Times cited : (11)

References (8)
  • 2
    • 0003710588 scopus 로고
    • Croton-on- Hudson, NY: North River Press
    • Goldratt, E.M., and R.E. Fox (1986). The Race. Croton-on- Hudson, NY: North River Press.
    • (1986) The Race
    • Goldratt, E.M.1    Fox, R.E.2
  • 3
  • 4
    • 0028744478 scopus 로고
    • Scheduling Semiconductor Manufacturing Plants
    • Kumar, S.E., Jones, L.Q. (1972). Scheduling Semiconductor Manufacturing Plants. IEEE Control Systems, 14(6), p33-40.
    • (1972) IEEE Control Systems , vol.14 , Issue.6 , pp. 33-40
    • Kumar, S.E.1    Jones, L.Q.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.