Performance and performance variations of sub-1THz detectors fabricated with 0.15 μm CMOS foundry process

Electronics Letters

Volumn 47, Issue 11, 2011, Pages 661-662

  Boppel, S ^a   Lisauskas, A ^a   Krozer, V ^a   Roskos, H G ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNA-COUPLED; CMOS PROCESS TECHNOLOGY; CMOS PROCESSS; COST-EFFICIENT; DETECTOR ARRAYS; INTER-CHIP; INTRA-CHIP VARIATION; MULTI-PIXEL; OPTIMUM OPERATIONS; PERFORMANCE VARIATIONS; RESPONSIVITY; STANDARD DEVIATION; TERA HERTZ;

ANTENNAS; CMOS INTEGRATED CIRCUITS; ELECTROMAGNETIC WAVES; FIELD EFFECT TRANSISTORS;

PIXELS;

EID: 79960812609     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2011.0687     Document Type: Article

References (7)

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3. Lisauskas, A., Von Spiegel, W., Boubanga-Tombet, S., El-Fatimy, A., Coquillat, D., Teppe, F., Dyakonova, N., Knap, W., and Roskos, H.G.: ' Terahertz imaging with GaAs field-effect transistors ', Electron. Lett., 2008, 44, (6), p. 408-409 10.1049/el:20080172 0013-5194 (Pubitemid 351388594)
4. Lisauskas, A., Pfeiffer, U., Öjefors, E., Haring Bolìvar, P., Glaab, D., and Roskos, H.G.: ' Rational design of high-responsivity detectors of terahertz radiation based on distributed self-mixing in silicon field-effect transistors ', J. Appl. Phys., 2009, 105, (11), p. 114511 10.1063/1.3140611 0021-8979
5. Öjefors, E., Pfeiffer, U., Lisauskas, A., and Roskos, H.G.: ' A 0.65 THz focal-plane array in a quarter-micron CMOS process technology ', IEEE J. Solid-State Circuits, 2009, 44, (7), p. 1968-1976 10.1109/JSSC.2009.2021911 0018-9200
6. Lisauskas, A., Glaab, D., Roskos, H.G., Öjefors, E., and Pfeiffer, U.R.: ' Terahertz imaging with Si MOSFET focal-plane arrays ', Proc. SPIE, 2009, 7215, p. 72150J 10.1117/12.809552
7. Öjefors, E., Baktash, N., Zhao, Y., Al Hadi, R., Sherry, H., and Pfeiffer, U.: ' Terahertz imaging detectors in a 65-nm CMOS SOI technology ', IEEE European Solid-State Circuits Conf., Seville, Spain, September, 2010, p. 486-489