Effect of substrate on the atomic structure and physical properties of thermoelectric Ca3Co4O9 thin films

Journal of Physics Condensed Matter

Volumn 23, Issue 30, 2011, Pages

  Qiao, Q ^a   Gulec, A ^a   Paulauskas, T ^a   Kolesnik, S ^b   Dabrowski, B ^b   Ozdemir, M ^c,d   Boyraz, C ^c,d   Mazumdar, D ^c   Gupta, A ^c   Klie, R F ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b NORTHERN ILLINOIS UNIVERSITY   (United States)

^c University of Alabama   (United States)

^d MARMARA UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL THICKNESS; CUBIC PEROVSKITE; DEFECT-FREE GROWTH; GROWTH OF FILMS; HIGH-TEMPERATURE THERMOELECTRIC APPLICATIONS; INTERLAYER INTERACTIONS; LAYERED COBALT OXIDES; LAYERED MATERIAL; POLY-CRYSTALLINE BULK; PULSED-LASER DEPOSITION TECHNIQUE; SIGNIFICANT IMPACTS; SRTIO; STRAIN-FREE; SYMMETRY MISMATCH; THERMOELECTRIC PROPERTIES; TRANSMISSION ELECTRON;

CALCIUM; COBALT COMPOUNDS; FILM GROWTH; HIGH TEMPERATURE APPLICATIONS; LATTICE MISMATCH; PEROVSKITE; PULSED LASER DEPOSITION; STACKING FAULTS; SUBSTRATES; TANTALUM; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COBALT;

EID: 79960796007     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/30/305005     Document Type: Article

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