A high temperature diffraction-resistance study of chalcopyrite, CuFeS 2

Journal of Solid State Chemistry

Volumn 184, Issue 8, 2011, Pages 2272-2277

  Engin, T E ^a,b,c   Powell, A V ^a   Hull, S ^b  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c NATIONAL METROLOGY INSTITUTE   (Turkey)

Author keywords

Electrical properties; In situ studies; Magnetism; Neutron diffraction; Sulphides

Indexed keywords

ABRUPT CHANGE; AMBIENT CONDITIONS; CRYSTALLOGRAPHIC SITES; DC RESISTANCE; ELECTRICAL RESISTIVITY; HIGH TEMPERATURE; IN-SITU; IN-SITU STUDIES; LONG RANGE MAGNETIC ORDER; SPACE GROUPS; STRUCTURAL MODELS; STRUCTURAL TRANSITIONS; SULPHIDES; ZINC BLENDE;

DIFFRACTION; ELECTRIC CONDUCTIVITY; MAGNETIC MOMENTS; MODEL STRUCTURES; POSITIVE IONS; SINGLE CRYSTALS; ZINC SULFIDE;

COPPER COMPOUNDS;

EID: 79960697309     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2011.06.036     Document Type: Article

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