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Physical Review Letters

Volumn 106, Issue 17, 2011, Pages

High resolution transmission electron microscope observation of zero-strain deformation twinning mechanisms in Ag

(4) Liu, L a Wang, J b Gong, S K a Mao, S X c

a BEIHANG UNIVERSITY (China)

b LOS ALAMOS NATIONAL LABORATORY (United States)

c University of Pittsburgh (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AG FILMS; DEFORMATION BEHAVIOR; DEFORMATION TWINNING; DETWINNING; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; INCOHERENT TWIN; MACROSCOPIC STRAINS; POLYCRYSTALLINE; SHOCKLEY PARTIAL DISLOCATIONS; STAKING FAULTS;

ELECTRON MICROSCOPES; NUCLEATION; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

DEFORMATION;

EID: 79960673839 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.106.175504 Document Type: Article

Times cited : (148)

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