Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 385, Issue 1-3, 2011, Pages 206-212

  Kwek, Jin W ^a   Vakarelski, Ivan U ^a,b   Ng, Wai K ^a   Heng, Jerry Y Y ^c   Tan, Reginald B H ^a,d  

^a INSTITUTE OF CHEMICAL AND ENGINEERING SCIENCES   (Singapore)

^b KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

^d NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Atomic force microscope; Electrostatic forces; Microparticles

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDENSERS (LIQUEFIERS); ELECTRIC FIELDS; ELECTRODES; ELECTROSTATIC DEVICES; INDIUM COMPOUNDS; ITO GLASS; MICROSCOPES; TIN; TIN OXIDES; TIN PLATE;

AFM CANTILEVERS; AMBIENT AIR CONDITIONS; APPLIED ELECTRIC FIELD; ATOMIC FORCE MICROSCOPES; BOTTOM ELECTRODES; ELECTRICAL FIELD; GLASS BEAD; IMAGE CHARGES; MICROPARTICLES; NET CHARGES; PARALLEL PLATES; POLARIZABILITIES; RELATIVE CONTRIBUTION; SINGLE PARTICLE;

ELECTROSTATIC FORCE;

GLASS; INDIUM TIN OXIDE;

AMBIENT AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; BIOTRANSFORMATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD; ELECTRODE; HYDROPHOBICITY; IMAGE ANALYSIS; MEASUREMENT; MOLECULAR ELECTRONICS; POLARIZATION; PRIORITY JOURNAL; STATIC ELECTRICITY; SURFACE CHARGE; SURFACE PROPERTY;

EID: 79960644738     PISSN: 09277757     EISSN: 18734359     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2011.06.008     Document Type: Article

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