Low-temperature sintering and microwave dielectric properties of 3Z2B glass-Al2O3 composites

Ceramics International

Volumn 37, Issue 7, 2011, Pages 2377-2382

  Zhou, Dong Xiang ^a   Sun, Rong Guang ^a   Gong, Shu Ping ^a   Hu, Yun Xiang ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

A. Sintering; B. X ray methods; C. Dielectric properties

Indexed keywords

A. SINTERING; ALUMINA FILLERS; C. DIELECTRIC PROPERTIES; CRYSTALLINE PHASE; CRYSTALLIZATION PHASIS; DENSIFICATION BEHAVIOR; DENSIFICATION MECHANISMS; GLASS CONTENT; GLASS MATRICES; LINEAR SHRINKAGE; LOW TEMPERATURE CO-FIRED CERAMICS; LOW-TEMPERATURE SINTERING; MICROWAVE DIELECTRIC PROPERTIES; OPTIMAL COMPOSITION; PHASE DEVELOPMENT; SINTERING TEMPERATURES; SYSTEM-BASED; X RAY METHODS; XRD PATTERNS; ZINC BORATE;

ALUMINUM; DENSIFICATION; FILLERS; GLASS; MICROWAVES; SINTERING; ZINC; ZINC OXIDE;

DIELECTRIC PROPERTIES OF SOLIDS;

EID: 79960318846     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2011.03.033     Document Type: Article

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