Surface processing of TlBr for improved gamma spectroscopy

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2010, Pages 3746-3748

  Voss, Lars F ^a   Conway, Adam M ^a   Graff, Robert T ^a   Beck, Patrick R ^a   Nikolic, Rebecca J ^a   Nelson, Art J ^a   Payne, Stephen A ^a   Kim, Hadong ^b   Cirignano, Len ^b   Shah, Kanai ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b RADIATION MONITORING DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ETCHING; CURRENT VOLTAGE; DEVICE PERFORMANCE; FIELD ANNEALING; GAMMA SPECTROSCOPY; MECHANICAL POLISHING; MICROHARDNESS MEASUREMENT; PLANAR DETECTORS; RADIATION MONITORING DEVICES; RADIATION RESPONSE; SURFACE DAMAGES; SURFACE PROCESSING;

CRYSTALS; MEDICAL IMAGING; NUCLEAR PHYSICS; NUCLEAR REACTORS; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; ULTRAVIOLET SPECTROSCOPY;

GAMMA RAYS;

EID: 79960315562     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2010.5874511     Document Type: Conference Paper

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